Burst Generators

Teseq offers high end combined or single function solutions for simulating Electric Fast Transients (EFT) for immunity testing in conformity with international, national and manufacturers’ standards including the latest IEC/EN 61000-4-4 standard. 

 

All models reach levels up to 4.8 kV and Coupling / Decoupling Networks (CDN’s) are available for single and 
three phase testing up to 200 A. 

 

Accessories such as coupling devices and verification sets can be found in our Transient Immunity Simulators brochure

NSG 3060

Multifunction Generator Systems - The Modular Solution For 6 KV Applications

  • Modular, expandable system 

  • Surge, EFT/Burst, Power Quality, Ring Wave, and more 

  • Surge voltage up to 6.6 kV for overtesting 

  • ANSI and IEC coupling methods 

  • Intuitive 7.2” color touch screen interface 

  • Expert mode for changing parameters while test is running (diagnostics) 

  • Status LEDs 

  • Safety connectors

Description

Teseq’s new NSG 3060 is an easy-to-use multifunction generator that simulates electromagnetic interference effects for immunity testing in conformity with international, national and manufacturers’ standards including the latest IEC/EN standards. The NSG 3060 system is designed to fulfill conducted EMC test requirements for CE mark testing and ANSI C62.41, including Combination Wave Surge (6.6 kV), Electrical Fast Transient (EFT) pulses (4.8 kV), Ring Wave (6.6 kV), and Power Quality Testing (PQT). Expansion capabilities enable the system to be configured for a much broader range of applications including Telecom Surge 10/700 and Magnetic Field tests. 

 

Featuring an innovative modular design, the NSG 3060 is a versatile system that can be configured for basic testing needs and expanded to meet the needs of sophisticated test laboratories. Teseq’s well proven “Master-Slave” architecture enables individual pulse modules to be calibrated separately, with calibration data and correction factors stored on the slave controller. New modules can be easily installed with no need to return the entire system for calibration. 
Depending on your exact testing needs, different models are available to ensure the NSG 3060 is configured to your exact testing requirements. 

Combination wave pulse 1, 2/50 - 8/20 μs (Hybrid-Surge pulse)
Pulse conforms to IEC/EN 61000-4-5 and ANSI (IEEE) 62.41 

Burst (EFT) 5/50 Ns
Pulse Conforms To IEC/EN 61000-4-4

Dips & Drops
Conforms To IEC/EN 61000-4-11, IEC/EN 61000-4-29 

Ringwave 0.5 Μs/100 KHz
Pulse Conforms To IEC/EN 61000-4-12 And ANSI (IEEE) C62.41 

Refer to to the NSG 3060 datasheet on the Downloads tab for complete and detailed parameter descriptions. 

NSG 3040

Multifunction Generator Systems - The Smart 4 KV Solution For CE Applications 

  • Modular, expandable system 

  • Surge, EFT/Burst, Power Quality and more 

  • Intuitive 7.2” color touch screen interface 

  • Expert mode for changing parameters while test is running (diagnostics) 

  • Status LEDs 

  • Safety connectors

Description

Teseq’s new NSG 3040 is an easy-to-use multifunction generator that simulates electromagnetic interference effects for immunity testing in conformity with international, national and manufacturers’ standards including the latest IEC/EN standards. The NSG 3040 system is designed to fulfill conducted EMC test requirements for CE mark testing, including Combination Wave Surge (4.4 kV), Electrical Fast Transient (EFT) pulses (4.8 kV) and Power Quality Testing (PQT). Expansion capabilities enable the system to be configured for a much broader range of applications including Telecom Surge 10/700 and Magnetic Field tests.

Featuring an innovative modular design, the NSG 3040 is a versatile system that can be configured for basic testing needs and expanded to meet the needs of sophisticated test laboratories. Teseq’s well proven “Master-Slave” architecture enables individual pulse modules to be calibrated separately, with calibration data and correction factors stored on the slave controller. New modules can be easily installed with no need to return the entire system for calibration.

Depending on your exact testing needs, different models are available to ensure the NSG 3040 is configured to your exact testing requirements. 

Combination wave pulse 1, 2/50 - 8/20 μs (Hybrid-Surge pulse)
Pulse conforms to IEC/EN 61000-4-5 

Burst (EFT) 5/50 Ns
Pulse Conforms To IEC/EN 61000-4-4 

Dips & Drops
Conforms To IEC/EN 61000-4-11, IEC/EN 61000-4-29 

Refer to to the NSG 3040 datasheet on the Downloads tab for complete and detailed parameter descriptions. 

NSG 3040-EFT 

Single Function Generator For EFT / Burst Pulses For Immunity Testing In Compliance With IEC 61000-4-4 Up To 4.8 KV. 

  • Fully IEC 61000-4-4 compliant 

  • 16 A single phase CDN 

  • Large 7.2" color display and touch panel interface 

  • Standards and user test libraries 

  • Wide range of accessories add your own text and edit me. It's easy.

Description

Teseq’s new NSG 3040-EFT is an easy-to-use single function generator that simulates electromagnetic interference effects for immunity testing in conformity with international, national and manufacturers’ standards including the latest IEC/EN standards. The NSG 3040-EFT system is designed to fulfill conducted EMC test requirements for CE mark testing for Electrical Fast Transient (EFT) pulses (4.8 kV). 

Burst (EFT) 5/50 Ns
Pulse Conforms To IEC/EN 61000-4-4 

NSG 3025 

Burst Generator 

  • Compact, full-capability instrument 

  • For standard tests to latest EN 61000-4-4, IEC 61000-4-4 (Amd.1 - 2010) 

  • Handles tests to product standards and company standards 

  • Designed for certification, development laboratories and on-site use 

Description

The compact NSG 3025 is fully capable of running standard tests to EN 61000-4-4, IEC 61000-4-4, etc. as well as handling tests to both product and company standards. It has been designed for certification, development laboratory and on-site purposes.

Application

Burst tests form a particularly powerful part of EMC test strategies: they are used to verify complete systems and identify disturbances in installations, as well for type testing. The high frequency components of the pulse help diagnose immunity failures caused by bad cabling or system composition, and can also indicate grounding problems.

Product Suggestions
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MD 4070

Monitoring Device 10 kHz to 400 (600) MHz

  • As required in IEC/EN 61000-4-6

  • Suitable for BCI testing per ISO 11452-4, RTCA/DO-160 section 20, MIL-STD-461 and various automotive standards

  • Active/passive operation for wide dynamic range

  • Suitable for NSG 4070

  • Ruggedly designed

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CHA 9652

Dual Directional Coupler 80 MHz to 1 GHz

  • Dual directional coupler

  • Wide frequency range

  • High power handling

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EM Clamp for IEC/EN 61000-4-6

  • As specified in IEC/EN 61000-4-6

  • Very efficient coupling

  • Can be used on almost any cable

  • Ruggedly designed

Address

PNK Engineering and Consultant Co., Ltd. 
222 UPA Place Building B  1st Floor
Soi Ramkumhange 164 Minburee 
Bangkok 10510

Contact

Tel +669 4412 5588   +66 2 170 9244
Fax +66 2 170 9245 

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